| ABBREVIATION | DEFINITION | | AGFM | Alternating Gradient Field Magnetometer | | AFC | Antiferromagnetically coupled Media | | AFM | Atomic Force Microscopy | | ALO | Anodised Aluminium Oxide | | BPM | Bit Patterned Media | | BW | Bandwidth | | EBL | Electron Beam Lithography | | EDX | Energy Dispersion Analysis | | ESM | Exchange spring media | | EU | European Union | | FE-SEM | Field Émission SEM | | FIB | Focused Ion Beam | | HAMR | Heat Assisted Magnetic Recording | | HR-TEM | High Resolution Transmission Electron Microscopy | | IT | Information Technologies | | IND | Industrial companies | | MFM | Magnetic Force Microscopy | | NIL | Nanoimprint Lithography | | NPPM | Nanoparticle patterned Media | | PDMS | Organic Mould | | PMR | Perpendicular Magnetic Recording | | PPM | Percolated Perpendicular Media | | PVD | Physical Vapour Deposition | | SEM | Scanning Electron Microscope | | SME | Small Medium Enterprize | | SQUID | Superconducting Quantum Interference Device | | SUL | Soft Underlayer | | TEM | Transmission Electron Microscopy | | T-NIL | Thermal-NIL | | VSM | Vibrating Sample Magnetometer | | XRD | X-Ray Diffraction |
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Last Updated on Tuesday, 25 November 2008 11:43 |